Open AccessSMALL-ANGLE X-RAY DIFFRACTION IN ANALYSES OF THE STRUCTURE OF COATINGS
Author(s) -
Jianzhong Shao,
Fan Zheng-Xiu,
Guodong Yin,
Lixiang Yuan
Publication year - 1994
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.43.958
Subject(s) - refraction , optics , bragg's law , period (music) , diffraction , materials science , x ray , x ray optics , physics , computational physics , acoustics
The period thickness mean refraction corrected factor and the ratio between two difference materials in a period can be deduced from the Bragg equation with refraction correction. Based on this Bragg's law and theory of optical thin film, the formula introduced in this paper have been verified in theory and experiment with short-period Mo/Si multilayers.