EFFECT OF GRAIN SIZE ON TEMPERATURE COEFFICIENT OF RESISTIVITY OF Pd THIN FILMS | Zendy

Xiaoping Wang | Zendy; ZHAO TE-XIU | Zendy; Hang Ji | Zendy; LIANG QI | Zendy; DONG YI | Zendy

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EFFECT OF GRAIN SIZE ON TEMPERATURE COEFFICIENT OF RESISTIVITY OF Pd THIN FILMS

Author(s) -

Xiaoping Wang,

ZHAO TE-XIU,

Hang Ji,

LIANG QI,

DONG YI

Publication year - 1994

Publication title -

acta physica sinica

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.199

H-Index - 47

ISSN - 1000-3290

DOI - 10.7498/aps.43.297

Subject(s) - grain size , electrical resistivity and conductivity , materials science , thin film , temperature coefficient , condensed matter physics , grain boundary , composite material , microstructure , nanotechnology , physics , quantum mechanics

The temperature coefficient of resistivity (TCR) of Pd thin film with different thicknesses and annealled at different tempertures has been investigated. The experi-mental results indicated that the TCR value of thin films is much smaller than that of bulk material and it also depcnds on grain size of the thin films. It was found that the TCR is higher for larger grain size. The result is explained readily by using the two-fluid model.

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