Open AccessEFFECT OF GRAIN SIZE ON TEMPERATURE COEFFICIENT OF RESISTIVITY OF Pd THIN FILMS
Author(s) -
Xiaoping Wang,
Tiansheng Zhao,
Hang Ji,
Qi Liang,
Dong Kee Yi
Publication year - 1994
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.43.297
Subject(s) - grain size , electrical resistivity and conductivity , materials science , thin film , temperature coefficient , condensed matter physics , grain boundary , composite material , microstructure , nanotechnology , physics , quantum mechanics
The temperature coefficient of resistivity (TCR) of Pd thin film with different thicknesses and annealled at different tempertures has been investigated. The experi-mental results indicated that the TCR value of thin films is much smaller than that of bulk material and it also depcnds on grain size of the thin films. It was found that the TCR is higher for larger grain size. The result is explained readily by using the two-fluid model.