THIN FILM STRESS EVALUATION BY A GLANCING X-RAY BEAM
Author(s) -
Kewei Xu,
Gao Runsheng,
Ligen Yu,
Jiawen He
Publication year - 1994
Publication title -
acta physica sinica
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.43.1295
Subject(s) - curvature , materials science , optics , thin film , beam (structure) , stress (linguistics) , plot (graphics) , physics , geometry , nanotechnology , mathematics , linguistics , philosophy , statistics
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