TEMPERATURE DEPENDENCE OF ELECTRIC RESISTIVITY OF Nd-Fe AMORPHOUS THIN FILMS AND ITS THERMAL STABILITY | Zendy

LU Manqi | Zendy; A. Wagendristel | Zendy

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TEMPERATURE DEPENDENCE OF ELECTRIC RESISTIVITY OF Nd-Fe AMORPHOUS THIN FILMS AND ITS THERMAL STABILITY

Author(s) -

LU Manqi,

A. Wagendristel

Publication year - 1993

Publication title -

acta physica sinica

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.199

H-Index - 47

ISSN - 1000-3290

DOI - 10.7498/aps.42.840

Subject(s) - materials science , amorphous solid , crystallization , electrical resistivity and conductivity , thermal stability , thin film , atmospheric temperature range , evaporation , flash evaporation , condensed matter physics , chemical engineering , thermodynamics , crystallography , nanotechnology , electrical engineering , physics , chemistry , engineering

The NdxFe1-x amorphous thin films with x=0.06-0.80 were prepared at 77 K by flash evaporation. The results show that the amorphous films are stable at room temperature when 0.192 and T untill the crystallization occurs. The crystallization of the amorphous films can not be completed at a certain fixed temperature but over a temperature range.

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