TEM STUDY OF MICROSTRUCTURAL CHANGES INDUCED BY AR ION IMPLANTATION IN YBa2Cu3O7-x SUPERCONDUCTING FILMS | Zendy

Yijie Li | Zendy; Guangcheng Xiong | Zendy; Zizhao Gan | Zendy; Congxin Ren | Zendy; Zou Shichang | Zendy

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TEM STUDY OF MICROSTRUCTURAL CHANGES INDUCED BY AR ION IMPLANTATION IN YBa2Cu3O7-x SUPERCONDUCTING FILMS

Author(s) -

Yijie Li,

Guangcheng Xiong,

Zizhao Gan,

Congxin Ren,

Zou Shichang

Publication year - 1993

Publication title -

acta physica sinica

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.199

H-Index - 47

ISSN - 1000-3290

DOI - 10.7498/aps.42.482

Subject(s) - fluence , materials science , superconductivity , epitaxy , ion , ion implantation , condensed matter physics , lattice (music) , oxygen , transition temperature , nanotechnology , chemistry , physics , organic chemistry , layer (electronics) , acoustics

Ar ion implantation induced superconductivity change and structural change in YBa2Cu3O7-x epitaxial films have been studied. After implantation, not only Jc and Tc of the sa-mples decreased with the increasing of Ar ion fluence, but also a metal-to-semiconducfor transition occurred. The TEM photographs showed that the lattice frame of the implanted sa-mples was nearly unchanged under low fluence. Only at high fluence, the structure was comple-tely destroyed. According to the experimental results, we suggest that the degradation of Jc and Tc may mainly result from the disordering of oxygen sublattice.

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