DEPENDENCE OF FIELD-IONIZATION THRESHOLD ON |ml| FOR RYDBERG STATES OF Sr ATOM
Author(s) -
Jing Li,
XU YUN-FEI,
WANG YUN-XIAN,
Sen Zhang
Publication year - 1993
Publication title -
acta physica sinica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.42.231
Subject(s) - atomic physics , ionization , rydberg formula , rydberg atom , atom (system on chip) , excitation , physics , electric field , field (mathematics) , above threshold ionization , field desorption , laser , photoionization , ion , optics , quantum mechanics , mathematics , pure mathematics , computer science , embedded system
We have obtained Rydberg atom of different |ml| value by two-step excitation using polarized lasers. The field-ionization thresholds for 5snd (n= 22-27), | ml| =0,1,2 Rydberg states of Sr atom is measured by using a pulse electric field (up to 2.4kV/cm). Second-order approximate formula of field-ionization threshold that depend on the |ml| value is obtained and compared with the measured data.
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