Open AccessPICOSECOND LUMINESCENCE DECAY MEASUREMENT FOR POROUS Si AND ANALYSIS OF EMISSION MECHANISM
Author(s) -
Xiaorong Zhang,
Xiaoguang Bao,
Y. Feng,
Gan Chang-Ming,
Zhenhua Cai,
Huang Xu-Guang,
Shiying Zhou
Publication year - 1993
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.42.1874
Subject(s) - picosecond , luminescence , materials science , spectroscopy , emission spectrum , porous silicon , fourier transform infrared spectroscopy , porous medium , infrared , photochemistry , photoluminescence , porosity , analytical chemistry (journal) , molecular physics , spectral line , optoelectronics , optics , chemistry , physics , silicon , composite material , laser , chromatography , quantum mechanics , astronomy
Luminescence spectra, picosecond decay and Fourier transform infrared spectroscopy measurements show that there are two independent emission mechanisms in the spontaneously oxidized porous Si. One is determined by the quantum confinement effect , the other is produced by the oxidation.