EFFECT OF SUBSTRATE TEMPERATURE ON ZnSe FILMS GROWN BY HOT WALL EPITAXY
Author(s) -
Lü HONG-QIANG,
Jie Wang,
Jun Shen,
Yong Liu,
Xun Wang,
WANG CHANG-PING,
Jianbao Wang,
Li Chen,
SHEN XIAO-LIANG
Publication year - 1992
Publication title -
acta physica sinica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.41.1308
Subject(s) - epitaxy , substrate (aquarium) , materials science , photoluminescence , raman scattering , raman spectroscopy , diffraction , layer (electronics) , optoelectronics , crystallography , optics , nanotechnology , chemistry , oceanography , physics , geology
In this paper, we report the results of the growth of a series of ZnSe films on (100) GaAs at different substrate temperatures by hot wall epitaxy. The quality of ZnSe films has been studied by X-ray diffraction, Raman scattering and photoluminescence. The results show that: 1) We have got (100)-oriented single crystal fillms, but the quality becomes worse when lowering the substrate temperature. When the substrate temperature is below 300℃ there appears the (111)-oriented twins in the (100ZnSe. 2) When the substrate temperature is 350℃, Ga atom diffusion from the substrate to the ZnSe epitaxial layer is serious.
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