Open AccessX-RAY PROFILE ANALYSIS ON DEFORMED SEMICRYSTAL LINE POLYETHYLENE FILMS
Author(s) -
Fei Teng,
Han Wei,
Yanling Liu,
Yuming Wang
Publication year - 1991
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.40.1955
Subject(s) - materials science , polyethylene , diffraction , composite material , deformation (meteorology) , yield (engineering) , scattering , plasticity , ultimate tensile strength , line (geometry) , stress (linguistics) , distortion (music) , optics , geometry , physics , optoelectronics , amplifier , linguistics , philosophy , cmos , mathematics
Analysis of X-ray scattering and diffraction profile for the uniaxial tensile specimens of polyethylene films at different deformation stages have been performed at room temperature. The results show that within elastic region before yielding and post-yield region, the micros-train (distortion) increases notably and the micrograin size does not change much, but within constant stress region of plastic flow, micrograin size decreases rapidly and microstrain changes only a little.