INTENSITY RATIO METHOD FOR MEASURING ANOMALOUS SCATTERING FACTOR | Zendy

ZongYan Zhao | Zendy; T. Fukamachi | Zendy; Masami Yoshizawa | Zendy; KENJI EHARA | Zendy; TETUO NAKAJIMA | Zendy; TAKAAKI KAWAMUKA | Zendy

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INTENSITY RATIO METHOD FOR MEASURING ANOMALOUS SCATTERING FACTOR

Author(s) -

ZongYan Zhao,

T. Fukamachi,

Masami Yoshizawa,

KENJI EHARA,

TETUO NAKAJIMA,

TAKAAKI KAWAMUKA

Publication year - 1991

Publication title -

acta physica sinica

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.199

H-Index - 47

ISSN - 1000-3290

DOI - 10.7498/aps.40.1460

Subject(s) - scattering , intensity (physics) , anomalous scattering , computational physics , absorption (acoustics) , form factor (electronics) , absorption edge , enhanced data rates for gsm evolution , optics , physics , atomic physics , materials science , condensed matter physics , quantum mechanics , computer science , telecommunications , band gap

This paper reports the study of the intensity ratio method for measuring anomalous scattering factor, by means of which the anomalous scattering factor of Ga atoms in GaAs near K absorption edge was well determined. This paper also discusses and deals with the problems that may appear when this method is used.

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