Open AccessINTENSITY RATIO METHOD FOR MEASURING ANOMALOUS SCATTERING FACTOR
Author(s) -
Zhibing Zhao,
T. Fukamachi,
Masami Yoshizawa,
K. Ehara,
T Nakajima,
Takaaki Kawamuka
Publication year - 1991
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.40.1460
Subject(s) - scattering , intensity (physics) , anomalous scattering , computational physics , absorption (acoustics) , form factor (electronics) , absorption edge , enhanced data rates for gsm evolution , optics , physics , atomic physics , materials science , condensed matter physics , quantum mechanics , computer science , telecommunications , band gap
This paper reports the study of the intensity ratio method for measuring anomalous scattering factor, by means of which the anomalous scattering factor of Ga atoms in GaAs near K absorption edge was well determined. This paper also discusses and deals with the problems that may appear when this method is used.