THE APPLICATION OF SECOND ORDER DIFFRACTION OF A MONOCHROMETER IN LABORATORY EXAFS MEASUREMENT | Zendy

Wencai Wang | Zendy; Yang Chun-lai | Zendy; Chen Yu | Zendy

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THE APPLICATION OF SECOND ORDER DIFFRACTION OF A MONOCHROMETER IN LABORATORY EXAFS MEASUREMENT

Author(s) -

Wencai Wang,

Yang Chun-lai,

Chen Yu

Publication year - 1990

Publication title -

acta physica sinica

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.199

H-Index - 47

ISSN - 1000-3290

DOI - 10.7498/aps.39.1684

Subject(s) - extended x ray absorption fine structure , diffraction , distortion (music) , materials science , absorption (acoustics) , impurity , spectral line , range (aeronautics) , absorption spectroscopy , amplitude , surface extended x ray absorption fine structure , optics , physics , computational physics , optoelectronics , quantum mechanics , amplifier , cmos , composite material

Some aspects on the application of second order diffraction of a monochrometer in laboratory EXAFS measurement are studied. Significant distortions in measured X-ray absorption fine structure occur when there are impurities' emission lines on the continuum spectra m the investigated energy range. A method for correcting that distortion is proposed. As the EXAFS amplitude decreases, which is caused by the application of second order diffraction of a monochrometer, how to obtain correct structural parameters is also discussed.

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