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SIMULATION STUDY OF DIVERGENT BEAM X-RAY DIFFRACTION BY CRYSTALS
Author(s) -
Jianzhong Zhang,
Cao Yanni
Publication year - 1990
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.39.124
Subject(s) - diffraction , x ray crystallography , beam (structure) , optics , diffraction topography , crystal (programming language) , materials science , line (geometry) , electron backscatter diffraction , crystallography , physics , geometry , computer science , mathematics , chemistry , programming language
Acoording to the crystal symmetry, diffraction geometry and the diffraction laws, the complicated divergent beam X-ray diffraction has been studied. A method for simulating such diffraction is described. The computer generated pseudo-Kossel line patterns are exactly consistent with those recorded in experiment and the indices of all diffraction lines in the patterns can be identified. A set of standard divergent diffraction diagrams related to 〈100〉, 〈110〉 and 〈111〉oriented Si single crystals are completed successfully by computer.

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