
X-RAY HUANG DIFFUSE SCATTERING FROM DEFECTS IN γ IRRADIATED LiF CRYSTAL
Author(s) -
Jiang Xiao-ming,
Ziqin Wang,
Qian Lin-Zhao
Publication year - 1989
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.38.529
Subject(s) - irradiation , diffractometer , materials science , crystal (programming language) , x ray , scattering , isotropy , optics , crystallographic defect , molecular physics , nuclear magnetic resonance , physics , nuclear physics , scanning electron microscope , composite material , computer science , programming language
Using X-ray diffractometer equipped with a premonochromator, X-ray Huang diffuse scattering from defects in γ irradiated LiF crysial has been measured with differential and integral methods. The results show that the strain field of irradiation defects in LiF crystal is nearly isotropic.