X-RAY HUANG DIFFUSE SCATTERING FROM DEFECTS IN γ IRRADIATED LiF CRYSTAL | Zendy

Jiang Xiaoming | Zendy; WU ZI-QIN | Zendy; QIAN LIN-ZHAO | Zendy

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X-RAY HUANG DIFFUSE SCATTERING FROM DEFECTS IN γ IRRADIATED LiF CRYSTAL

Author(s) -

Jiang Xiaoming,

WU ZI-QIN,

QIAN LIN-ZHAO

Publication year - 1989

Publication title -

acta physica sinica

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.199

H-Index - 47

ISSN - 1000-3290

DOI - 10.7498/aps.38.529

Subject(s) - irradiation , diffractometer , materials science , crystal (programming language) , x ray , scattering , isotropy , optics , crystallographic defect , molecular physics , nuclear magnetic resonance , physics , nuclear physics , scanning electron microscope , composite material , computer science , programming language

Using X-ray diffractometer equipped with a premonochromator, X-ray Huang diffuse scattering from defects in γ irradiated LiF crysial has been measured with differential and integral methods. The results show that the strain field of irradiation defects in LiF crystal is nearly isotropic.

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