Open AccessAPPLICATION OF X-RAY PROFILE FOURIER ANALYSIS TO PREDICT MECHANICAL PROPERTIES OF ALLOYS
Author(s) -
TENG FENG-EN,
Xiang-Xu Cui
Publication year - 1989
Publication title -
acta physica sinica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.38.1845
Subject(s) - materials science , fourier transform , fourier analysis , x ray , optics , physics , mathematical analysis , mathematics
The defect configuration relates directly to the mechanical behaviour of structural materials. Especially, dislocation substructure, DSS, is one of the most important configurations. In this paper, a realistic x-ray diffraction profile analysis of DSS, developed by Wang, is reviewed and illustrated. Its application to predicting quantitatively mechanical properties is made.
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