Open AccessMEASUREMENT OF ANISOTROPIC OPTICAL CONSTANTS BY ELLIPSOMETRY APPL ICATION ON KNSBM FERROELECTRIC CRYSIALS
Author(s) -
陈树光 胡其宏
Publication year - 1989
Publication title -
acta physica sinica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.38.1245
Subject(s) - ferroelectricity , anisotropy , materials science , ellipsometry , optics , condensed matter physics , optoelectronics , physics , nanotechnology , thin film , dielectric
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