Open AccessDETERMINATION OF HYDROGEN DEPTH PROFILE IN SOLIDS BY DETECTION OF RECOILED PROTON WITH MeV F IONS
Author(s) -
Jiarui Liu,
Zhu Peiran,
A. Feng,
Li Da-Wan
Publication year - 1988
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.37.71
Subject(s) - ion , elastic recoil detection , tandem accelerator , hydrogen , atomic physics , materials science , scattering , resolution (logic) , proton , physics , optics , nuclear physics , quantum mechanics , artificial intelligence , computer science
Depth profiling of hydrogen in solids has been performed by Elastic Recoil Detection (ERD) with multicharged F ions at a 1.7 MV Tandem accelerator. Both experimental and theoretical analysis show the depth resolution of about 200-300 ? in the near-surface regions of solids. The optimization of the experimental conditions such as scattering geometry and incident beam energy are discussed. The comparison of ERD with multicharged F ions and 1H(19F,αγ)16O resonance reaction at 6.4 MeV for the same samples demonstrated that hydrogen profiling by ERD with F ions is a fast and economic method with low radiation damage and perfect depth resolution.