THE EFFECT OF ANNEALING ON THE X-RAY DIFFRACTION OF W/C PERIODIC MULTILAYERS | Zendy

Jiang Xiaoming | Zendy; Jiang Zui-Min | Zendy; Wenhan Liu | Zendy; WU ZI-QIN | Zendy

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THE EFFECT OF ANNEALING ON THE X-RAY DIFFRACTION OF W/C PERIODIC MULTILAYERS

Author(s) -

Jiang Xiaoming,

Jiang Zui-Min,

Wenhan Liu,

WU ZI-QIN

Publication year - 1988

Publication title -

acta physica sinica

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.199

H-Index - 47

ISSN - 1000-3290

DOI - 10.7498/aps.37.1893

Subject(s) - annealing (glass) , diffraction , materials science , amorphous solid , x ray crystallography , optics , bragg peak , bragg's law , x ray , condensed matter physics , crystallography , physics , composite material , chemistry , beam (structure)

The behaviors of amorphous W/C periodic multilayers after annealing have been studied by precise low-angle X-ray diffraction. Afte refraction correction, the period of multilayers can be calculated more accurately using th low angle peaks. The period increases with increasing annealing temperatures. The intensities of 2nd and 3rd Bragg diffraction also increase with the annealing temperatures. These phenomena can be interpreted by the increase of thickness of the carbon layers.

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