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INFLUENCE OF ENERGY RESOLUTION ON EXAFS
Author(s) -
Chenxi Li,
Lu Kun-Quan,
Yaqin Zhao
Publication year - 1987
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.36.1496
Subject(s) - extended x ray absorption fine structure , resolution (logic) , surface extended x ray absorption fine structure , energy (signal processing) , materials science , amplitude , displacement (psychology) , atomic physics , physics , optics , absorption spectroscopy , computer science , quantum mechanics , artificial intelligence , psychology , psychotherapist
The finite energy resolution of EXAFS spectrometer is an important effect on EXAFS measurement. It lowers the EXAFS amplitude and the decrement in smaller k is greater than that in larger k. That causes smaller coordination number and the relative mean square displacement obtained from EXAFS data. This paper proposes a method to calculate the effect of the resolution on the structural parameters extracted from EXAFS. Structural parameters of Ge and Ni, as examples, were measured and calculated with different resolutions and the results are consistent with each other. The manner of how the effect occurs is discussed and a method to correct the influence of the finite energy resolution is presented.

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