Open AccessOPTICAL PROPERTIES AND DIELECTRIC CONSTANTS OF CESIUM OXIDE THIN FILMS
Author(s) -
Quantan Wu,
Jianping Li,
Dong YlN-WU
Publication year - 1987
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.36.101
Subject(s) - materials science , wavelength , dielectric , refractive index , impurity , molar absorptivity , caesium , optics , extinction (optical mineralogy) , oxide , infrared , thin film , scattering , atomic physics , optoelectronics , physics , chemistry , inorganic chemistry , nanotechnology , quantum mechanics , metallurgy
Optical constants and dielectric constants of normal cesium oxide thin films are related to wavelength of incident light and cesium impurity contained. In this paper, three curves for index of refraction n and extinction coefficient k and complex dielectric constants of cesium oxide with different Cs impurity contents are shown with respect 10 wavelength in visible and infrared lights. The relations between the colors of scattering and reflection lights and these curves are discussed.