
THE PHYSICAL KINETICS OF STRUCTURAL RELIABILITY
Author(s) -
Xing Xiu-San
Publication year - 1986
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.35.741
Subject(s) - reliability (semiconductor) , failure rate , probability density function , reliability engineering , statistical physics , materials science , structural reliability , stochastic process , computer science , thermodynamics , physics , mathematics , statistics , probabilistic logic , engineering , power (physics) , artificial intelligence
In this paper, with stochastic process method, we try to construct a microscopic kinetic theory of structural reliability from microscopic mechanism of structual element fracture. The kinetic equation of failure evolution and the primary probability function of reliability analysis are given, and the failure probability, failure probability density, reliability, failure rate and average life have been derived.