Open AccessCONVERGENT-BEAM ELECTRON DIFFRACTION STUDY OF TRANSVERSE BASAL STACKING FAULTS IN LAYER STRUCTURES
Author(s) -
Feng Guo-Guang
Publication year - 1986
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.35.274
Subject(s) - stacking , diffraction , electron diffraction , materials science , transverse plane , crystal (programming language) , stacking fault , beam (structure) , condensed matter physics , molecular physics , optics , crystallography , physics , chemistry , nuclear magnetic resonance , structural engineering , computer science , programming language , engineering
Convergent-beam electron diffraction zone-axis patterns have been obtained from transverse basal stacking faults in graphite and molybdenite. These patterns show a reduced symmetry and split reflections. The splitting and unsplitting of the reflections correspond to the visibility and invisibility of the stacking faults in the theory of diffraction contrast of imperfect crystals. This analysis can be extended to zone-axis patterns obtained from other crystal defects.