
INVESTIGATION OF“NEGATIVE PEAK”IN EXAFS MEASUREMENT
Author(s) -
韩福森,
陆坤权,
常龙存
Publication year - 1985
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.34.396
Subject(s) - extended x ray absorption fine structure , diffraction , optics , materials science , beam (structure) , interpretation (philosophy) , physics , computational physics , absorption spectroscopy , computer science , programming language
The EXAFS measurement needs to disperse the incident X-ray beam with monochro-mating crystal. Beside the. continuous and some characteristic spectrum from nonsynch-rotron radiation, "negative peak" sometimes occur. It will distort the signal desired. This paper reports the detailed investigation of the "negative peak" and the interpretation with X-ray multiple diffraction. Fially, the method to avoid it is discussed.