Open AccessNONLINEAR BEHAVIOR OF TEARING MODES NEAR THRESHOLD
Author(s) -
S. Guo,
Cai Shi-dong
Publication year - 1984
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.33.861
Subject(s) - tearing , nonlinear system , physics , dimensionless quantity , classification of discontinuities , resistive touchscreen , logarithm , amplitude , bifurcation , mathematical analysis , pinch , mechanics , classical mechanics , quantum mechanics , mathematics , thermodynamics , electrical engineering , engineering
The nonlinear evolution equation of the resistive m≥2 tearing modes near their linear thresholds is derived as ?-Q2A+K/2A2à-Q2(δ△1e)/(△1e)A3=0 where the quasilinear approximation has been used; A is the mode amplitude; Q and K are the dimensionless linear growth rate and wave vector; △e and δ△1e are the linear and nonlinear discontinuities of the logarithmic derivatives. The nonlinear time evolutions of the modes are discussed in detail. No bifurcation solution exists for a symmetrical sheet pinch model.