Open AccessSPECIFIC CONTACT RESISTANCE OF METAL-BULK SEMI-CONDUCTOR——FOUR-POINT CONFIGURATION MODEL
Author(s) -
Chen Cun-Li
Publication year - 1984
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.33.1314
Subject(s) - conductor , contact resistance , measure (data warehouse) , materials science , point (geometry) , metal , condensed matter physics , physics , geometry , composite material , mathematics , computer science , metallurgy , layer (electronics) , database
In this paper, a method to measure the specific contact resistance ρc of M-S bulk sample-the four-point configuration model-is presented. The location of. four circular metal electrodes is arbitrary and the equations for specific contact resistance ρc have been derived. It is shown that if the sample is not semi-infinite but has a definite thickness, the equation must be modified with some correction factors. According to this model, we carried out some measurements and calculations, the results are in good agreement with that of reference [7].