Open AccessSTRUCTURAL CHARACTERISTICS OF THIN FILMS OF WHITE MICA
Author(s) -
XUE ZENG-QUAN,
ZHANG CUN-GUI,
LIU WEI-MIN,
WU QUAN-DE
Publication year - 1983
Publication title -
acta physica sinica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.32.1489
Subject(s) - mica , materials science , thin film , impurity , transmission electron microscopy , scanning electron microscope , substrate (aquarium) , scanning transmission electron microscopy , chemical composition , crystallography , optics , composite material , nanotechnology , chemistry , geology , physics , oceanography , organic chemistry
In this work, the structure and chemical composition of thin films of white mica found in Si-Chuan Province are studied by transmission electron microscopy and scanning electron microscopy. The. thickness is in the range of 300-1000?. It is concluded that the sample is nearly perfectly crystalline and contains no detectable impurities, however some defects are discovered in certain regions as shown in the text (Fig. 2-4).Thin mica film can be used as a substrate on which other thin film can deposit or grow into large crystalline grains.
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