Open AccessTHE OBSERVATION ON DEFECTS IN YAG SINGLE CRYSTAL BY X-RAY TRANSMISSION TOPOGRAPHY
Author(s) -
Mai Zhang,
Peiwen Ge,
Cu I Shu-Fan,
Xiao Nan,
Wu Lan-Sheng
Publication year - 1981
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.30.999
Subject(s) - striation , materials science , dislocation , czochralski method , perpendicular , single crystal , optics , x ray , crystal (programming language) , crystallographic defect , transmission (telecommunications) , crystallography , condensed matter physics , optoelectronics , physics , geometry , silicon , composite material , chemistry , programming language , mathematics , computer science , electrical engineering , engineering
It was the first time to investigate defects in YAG single crystal grown by Czochralski method by means of X-ray transmission topography. Several grown-in defects, such as growth striations, singular facets and dislocation bands perpendicular to the grown striation, were revealed. The configuration and formation of these defects were discussed in brief.