THE OBSERVATION ON DEFECTS IN YAG SINGLE CRYSTAL BY X-RAY TRANSMISSION TOPOGRAPHY | Zendy

MAI ZHEN-HONG | Zendy; Peiwen Ge | Zendy; CU I SHU-FAN | Zendy; XIAO NAN | Zendy; WU LAN-SHENG | Zendy

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THE OBSERVATION ON DEFECTS IN YAG SINGLE CRYSTAL BY X-RAY TRANSMISSION TOPOGRAPHY

Author(s) -

MAI ZHEN-HONG,

Peiwen Ge,

CU I SHU-FAN,

XIAO NAN,

WU LAN-SHENG

Publication year - 1981

Publication title -

acta physica sinica

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.199

H-Index - 47

ISSN - 1000-3290

DOI - 10.7498/aps.30.999

Subject(s) - striation , materials science , dislocation , czochralski method , perpendicular , single crystal , optics , x ray , crystal (programming language) , crystallographic defect , transmission (telecommunications) , crystallography , condensed matter physics , optoelectronics , physics , geometry , silicon , composite material , chemistry , programming language , mathematics , computer science , electrical engineering , engineering

It was the first time to investigate defects in YAG single crystal grown by Czochralski method by means of X-ray transmission topography. Several grown-in defects, such as growth striations, singular facets and dislocation bands perpendicular to the grown striation, were revealed. The configuration and formation of these defects were discussed in brief.

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