Open AccessTHE CHARACTERISTIC X-RAY INTENSITY FACTORS OF THE PURE ELEMENT BULK SAMPLES
Author(s) -
Wei Cai,
Ge Sen-Lin,
Ziqin Wang
Publication year - 1981
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.30.895
Subject(s) - intensity (physics) , atomic physics , materials science , electron , scattering , diffusion , excited state , x ray , absorption (acoustics) , physics , optics , thermodynamics , nuclear physics , composite material
The K-series X-ray intensities of eight pure elements (from Al to Ge) and the L-series X-ray intensities of four pure elements (from Ni to Ge) excited by 15-30 keV electrons have been measured. Using the modified and simplified "full diffusion" electron diffusion model the ratios of the characteristic X-ray intensities) of these pure elements have been calculated. The back scattering effect is included in this model itself and the absorption correction factors are obtained from the stepped intensity-depth distribution derived from this model. Moreover the continuum fluorescence effect is also considered. The calculated values are in agreement with the experimental data, therefore the reliability of the model is verified.