Open AccessNO-STANDARDS QUANTITATIVE EDS ANALYSIS OF THE CONSTITUENTS OF BINARY ALLOYS CONTAINING LIGHT ELEMENTS
Author(s) -
Renji Zhang,
Ge Sen-Lin,
Ziqin Wang
Publication year - 1981
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.30.208
Subject(s) - diffusion , binary number , materials science , intensity (physics) , quantitative analysis (chemistry) , distribution (mathematics) , scattering , analytical chemistry (journal) , computational physics , optics , thermodynamics , physics , chemistry , mathematics , mathematical analysis , chromatography , arithmetic
In this article, the no-standards quantitative analysis method using the ratios of the X-ray intensities of the elements in the samples has been improved. The "full diffusion" model of the electron scattering has been properly modified and simplified and a stepped depth distribution curve of the X ray has been obtained. From this distribution curve, the quantitative relationship between the constituents of samples and the intensities of the characteristic X-rays has been determined. The analysed values of the Cu-Si, FeS2 NaCl and GaAs are coincident with the actual values. Our results are better in some extent than the results of Russ's method which used the calculated X-ray intensity factors of pure elements and the routine ZAF correction. The calculation procedure of our method is also simpler than the procedure of the latter method.