THE OBSERVATION OF DEFECTS IN SYNTHETIC QUARTZ BY X-RAY TOPOGRAPHY | Zendy

MAI ZHEN-HONG | Zendy; Peiwen Ge | Zendy; CUI SHU-FAN | Zendy; WU LAN-SHENG | Zendy

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THE OBSERVATION OF DEFECTS IN SYNTHETIC QUARTZ BY X-RAY TOPOGRAPHY

Author(s) -

MAI ZHEN-HONG,

Peiwen Ge,

CUI SHU-FAN,

WU LAN-SHENG

Publication year - 1981

Publication title -

acta physica sinica

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.199

H-Index - 47

ISSN - 1000-3290

DOI - 10.7498/aps.30.1106

Subject(s) - quartz , x ray , materials science , crystal (programming language) , fault (geology) , crystallographic defect , ion , crystallography , optics , geology , composite material , physics , chemistry , seismology , computer science , programming language , quantum mechanics

The grown-in defects in a synthetic quartz crystal grown from a 2-cut seed plate have been surveyed by X-ray topography and ion probe method. Besides usual dislocations, it has also been found some rare fault surfaces which have not been reported so far. The configuration, fault vector and formation of the fault surfaces are discussed.

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