Open AccessTHE OBSERVATION OF DEFECTS IN SYNTHETIC QUARTZ BY X-RAY TOPOGRAPHY
Author(s) -
Mai Zhang,
Peiwen Ge,
Shujuan Cui,
Wu Lan-Sheng
Publication year - 1981
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.30.1106
Subject(s) - quartz , x ray , materials science , crystal (programming language) , fault (geology) , crystallographic defect , ion , crystallography , optics , geology , composite material , physics , chemistry , seismology , computer science , programming language , quantum mechanics
The grown-in defects in a synthetic quartz crystal grown from a 2-cut seed plate have been surveyed by X-ray topography and ion probe method. Besides usual dislocations, it has also been found some rare fault surfaces which have not been reported so far. The configuration, fault vector and formation of the fault surfaces are discussed.