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X-RAY TOPOGRAPHICAL STUDY ON DEFECTS IN α-LiIO<sub>3</sub> DECORATED BY SPACE CHARGE DUE TO THE APPLIED DC FIELDS
Author(s) -
古元新,
葛培文,
赵雅琴,
胡伯清,
吴兰生,
傅全贵
Publication year - 1980
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.29.711
Subject(s) - diffraction , crystal (programming language) , space charge , materials science , distortion (music) , optics , condensed matter physics , polarity (international relations) , contrast (vision) , x ray , relaxation (psychology) , voltage , electric field , physics , optoelectronics , electron , chemistry , amplifier , quantum mechanics , psychology , social psychology , biochemistry , cmos , computer science , cell , programming language
The diffraction contrast in the X-ray topographs, taken for the crystal face parallel to the c-axis of the α-LiIO3 single crystals, appears to change remarkably under the action of an applied DC field along the c axis. The contrast in the topographs is restored after the removal of the applied field. After either turning on or turning off the DC voltage, relaxation processes are observed in both the change and the restoration of the diffraction contrast in the X-ray topographs. The change of the contrast depends on the polarity and magnitude of the applied voltage, but appears to be independent of the wave length of the X-ray.The X-ray topographs taken under the condition that a DC field is applied to the crystal displays the macroscopic crystal defects decorated by the space charges. In other words, we can observe the originally undetectable defects, while the space charges accumulate on the crystal defects, the local lattice distortion around the defects is enhanced.

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