Open AccessX-RAY DIFFRACTION TOPOGRAPHIC STUDY OF CRYSTAL DEFECT IN LiNbO<sub>3</sub>
Author(s) -
周衡南,
蒋树声
Publication year - 1980
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.29.374
Subject(s) - materials science , ferroelectricity , diffraction , optics , x ray , diffraction topography , scattering , crystal (programming language) , transmission electron microscopy , invisibility , domain (mathematical analysis) , crystallography , single crystal , condensed matter physics , crystallographic defect , x ray crystallography , optoelectronics , physics , nanotechnology , chemistry , mathematical analysis , mathematics , programming language , computer science , dielectric
Various kinds of crystal defects, such as ferroelectric domain boundaries, growth bands, dislocations, subgrain boundaries and cellular structures, etc. in Czochraski-grown ferroelectric LiNbO3 single crystals were investigated by X-ray transmission topographic technique. The defects were identified by means of invisibility conditions using different diffractions, as well as X-ray anomalous scattering effect and optical microscopy. We have discussed the formation of domain boundaries in LiNbO3 and their relation to the growth bands.