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AN X-RAY METHOD OF DETERMINING THE DEGREE OF PREFERRED ORIENTATION OF FERROELECTRIC MATERIAL WITH LAYER TYPE STRUCTURE AFTER HOT-PRESSING
Author(s) -
Chucai Guo,
Wu Yu-Qin
Publication year - 1980
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.29.1640
Subject(s) - materials science , pressing , ferroelectricity , hot pressing , layer (electronics) , orientation (vector space) , ceramic , bismuth , composite material , degree (music) , diffraction , oxide , ferroelectric ceramics , x ray , intensity (physics) , optics , dielectric , geometry , optoelectronics , metallurgy , mathematics , acoustics , physics
The definition and an X-ray determination method of the degee of preferred orientation of ferroelectric ceramics with layer type structure after hot-pressing procedure are presented. The degree of preferred orientation can be obtained by merely determining the ratio of diffraction intensity of any one or more (00l) lines before and after hot-pressing procedure. Taking the mixed bismuth oxide compound with layer type structure PbBi4Ti4O15 as an example the suitability of this method has been proved.

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