
X-RAY POWDER DIFFRACTION STUDY OF MIXED BISMUTH OXIDE FERROELECTRICS WITH LAYER TYPE STRUCTURE PbBi<sub>4</sub>Ti<sub>4</sub>O<sub>15</sub> AND SrBi<sub>4</sub>Ti<sub>4</sub>O<sub>15</sub>
Author(s) -
Chucai Guo,
Wu Yu-Qin
Publication year - 1980
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.29.1490
Subject(s) - bismuth , orthorhombic crystal system , materials science , diffraction , powder diffraction , diffractometer , x ray crystallography , mixed oxide , neutron diffraction , oxide , x ray , crystallography , optics , physics , composite material , chemistry , metallurgy , scanning electron microscope
The X-ray powder diffraction patterns of mixed bismuth oxide ferroelectrics with layer type structure PbBi4Ti4O15 and SrBi4Ti4O15 were obtained with a counter diffractometer and a Guinier focusing camera using Cu Ka radiation. The detail indexed powder diffraction data of 88 and 76 diffraction lines of which d value are larger than 1.13? were given. The crystals belong to the orthorhombic system with a space group of Bb21m(C2v12). The lattice parameters and density calculated from X-ray measurements are:PbBi4Ti4O15: a = 5.431?, a = 5.459?,c = 41.36?;Z = 4;DX = 7.986g/cm3. SrBi4Ti4O15;a = 5.428?, 6 = 5.438?, c = 40.94?;Z = 4; Dx = 7.447g/cm3.