Open AccessIMAGE DECONVOLUTION IN HIGH RESOLUTION ELECTRON MICROSCOPY BY MAKING USE OF SAYRE'S EQUATION
Author(s) -
Fanghua Li,
FAN HAI-FU
Publication year - 1979
Publication title -
acta physica sinica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.28.276
Subject(s) - deconvolution , electron microscope , resolution (logic) , high resolution , electron , materials science , optics , computer science , physics , artificial intelligence , quantum mechanics , remote sensing , geology
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