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MEASUREMENT OF THE BAND WIDTH OF ELECTRON CHANNELLING PATTERNS IN SCANNING ELECTRON MICROSCOPY
Author(s) -
ZHANG JING-GUO
Publication year - 1978
Publication title -
acta physica sinica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.27.470
Subject(s) - channelling , scanning electron microscope , electron , materials science , scanning confocal electron microscopy , electron microscope , atomic physics , optics , physics , nuclear physics , ion , quantum mechanics

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