
MEASUREMENT OF THE BAND WIDTH OF ELECTRON CHANNELLING PATTERNS IN SCANNING ELECTRON MICROSCOPY
Author(s) -
Jingguo Zhang
Publication year - 1978
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.27.470
Subject(s) - channelling , scanning electron microscope , electron , materials science , scanning confocal electron microscopy , electron microscope , atomic physics , optics , physics , nuclear physics , ion , quantum mechanics