Open AccessAN X-RAY METHOD FOR IDENTIFYING COALESCENCE SEQUENCE OF SILICON CARBIDE POLYTYPES
Author(s) -
KUO CHANG-LIN
Publication year - 1965
Publication title -
acta physica sinica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.21.503
Subject(s) - silicon carbide , coalescence (physics) , materials science , silicon , crystallography , carbide , x ray , layer (electronics) , nanotechnology , optics , optoelectronics , composite material , physics , chemistry , astrobiology
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