
X-RAY MEASUREMENT OF THE THERMAL EXPANSION OF GERMANIUM, SILICON, INDIUM ANTIMONIDE AND GALLIUM ARSENIDE
Author(s) -
Shaw Nan,
Liu Yi-huan
Publication year - 1964
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.20.699
Subject(s) - indium antimonide , germanium , gallium antimonide , silicon , materials science , lattice constant , thermal expansion , gallium arsenide , indium , diffraction , analytical chemistry (journal) , condensed matter physics , optoelectronics , optics , superlattice , physics , chemistry , metallurgy , chromatography