Open AccessTHE DIFFUSION LENGTH OF MINORITY CARRIERS IN N-TYPE SILICON MEASURED WITH A SURFACE BARRIER DETECTOR
Author(s) -
TANG PU-SHAN,
HUO MING-HSIA,
CHEN TSO-YU,
W. K. Chu
Publication year - 1963
Publication title -
acta physica sinica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.19.448
Subject(s) - diffusion , silicon , materials science , detector , diffusion barrier , layer (electronics) , condensed matter physics , molecular physics , optics , physics , optoelectronics , nanotechnology , thermodynamics
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