Open AccessMEASUREMENT OF MINORITY CARRIER LIFETIME IN Ge AND Si BY THE SPREADING-RESISTANCEPHOTO-DECAY METHOD
Author(s) -
Zhuang Wei-hwa,
Guisheng Pan
Publication year - 1963
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.19.191
Subject(s) - recombination , physics , germanium , absorption (acoustics) , carrier lifetime , materials science , atomic physics , silicon , optics , optoelectronics , chemistry , biochemistry , gene