Open AccessTHE MEASUREMENT OF THE LIFE TIME OF MINORITY CURRENT CARRIERS IN SEMICONDUCTORS BY OBSERVING THE PHOTO-CONDUCTIVE DECAY OF THE SPREADING RESISTANCE UNDER A POINT CONTACT
Author(s) -
Wang Shou-wu
Publication year - 1963
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.19.176
Subject(s) - semiconductor , electrical conductor , materials science , current (fluid) , contact resistance , point (geometry) , spreading resistance profiling , condensed matter physics , engineering physics , optoelectronics , physics , nanotechnology , silicon , composite material , thermodynamics , geometry , mathematics , layer (electronics)