Open AccessBY THE SPECTRUM LINE WIDTH METHODS TO ANALYZE LAYER AFTER LAYER THE ALUMINIZED STEEL
Author(s) -
物理学报
Publication year - 1959
Publication title -
acta physica sinica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.15.305
Subject(s) - layer (electronics) , materials science , spectrum (functional analysis) , line width , line (geometry) , composite material , optics , physics , geometry , mathematics , quantum mechanics
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