Open AccessA Study on Low Area ESD Protection Circuit with Improved Electrical Characteristics
Author(s) -
Kyoung-Il Do,
Jun-Geol Park,
Min-Ju Kwon,
KyeongHyeon Park,
Yong-Seo Koo
Publication year - 2016
Publication title -
journal of ikeee
Language(s) - English
Resource type - Journals
eISSN - 2288-243X
pISSN - 1226-7244
DOI - 10.7471/ikeee.2016.20.4.361
Subject(s) - electrostatic discharge , electrical engineering , voltage , stack (abstract data type) , bipolar junction transistor , materials science , transistor , electronic engineering , engineering , computer science , programming language
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