Open AccessBivariate reliability models with multiple dynamic competing risks
Author(s) -
JuYoung Kim,
Ji Hwan
Publication year - 2016
Publication title -
journal of the korean data and information science society
Language(s) - Uncategorized
Resource type - Journals
ISSN - 1598-9402
DOI - 10.7465/jkdi.2016.27.3.711
Subject(s) - bivariate analysis , reliability (semiconductor) , reliability engineering , computer science , econometrics , statistics , mathematics , engineering , physics , power (physics) , quantum mechanics