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Study of thermal degradation of AuGeNi ohmic contacts of resonant tunneling diodes based on nanoscale AlAs / GaAs heterostructures
Author(s) -
Mstislav Makeev,
Yury A. Ivanov,
С. А. Мешков,
В. Н. Назаров
Publication year - 2012
Publication title -
nauka i obrazovanie
Language(s) - English
Resource type - Journals
ISSN - 1994-0408
DOI - 10.7463/0912.0453636
Subject(s) - ohmic contact , quantum tunnelling , nanoscopic scale , materials science , heterojunction , optoelectronics , degradation (telecommunications) , diode , nanotechnology , electronic engineering , layer (electronics) , engineering

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