Examination of Film Thickness Dependence on Acoustic Impedance of Gold and Chromium Thin Films by Scanning Acoustic Microscopy
Author(s) -
Bükem Tanören
Publication year - 2021
Publication title -
international journal of advances in engineering and pure sciences
Language(s) - English
Resource type - Journals
ISSN - 2636-8277
DOI - 10.7240/jeps.943771
Subject(s) - materials science , acoustic impedance , scanning acoustic microscope , thin film , electrical impedance , acoustic microscopy , evaporation , scanning electron microscope , optics , composite material , microscopy , analytical chemistry (journal) , nanotechnology , chemistry , physics , electrical engineering , engineering , chromatography , thermodynamics
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