Open AccessSampling Plans Based on Truncated Life Test for a Generalized Inverted Exponential Distribution
Author(s) -
Sukhdev Singh,
Yogesh Mani Tripathi,
ChiHyuck Jun
Publication year - 2015
Publication title -
industrial engineering and management systems
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.168
H-Index - 12
eISSN - 2234-6473
pISSN - 1598-7248
DOI - 10.7232/iems.2015.14.2.183
Subject(s) - percentile , acceptance sampling , exponential distribution , exponential function , statistics , set (abstract data type) , mathematics , sampling (signal processing) , test plan , plan (archaeology) , mathematical optimization , computer science , reliability engineering , engineering , sample size determination , weibull distribution , mathematical analysis , filter (signal processing) , computer vision , programming language , archaeology , history
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