Open AccessRaman and Ellipsometric Investigation of 570 nm CdTe thin film layer deposited by RF-Sputtering system
Author(s) -
Andra Naresh Kumar Reddy,
Mahdieh Hashemi,
Prabhat Verma,
Svetla. Khonina
Publication year - 2019
Publication title -
optica pura y aplicada
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.147
H-Index - 11
eISSN - 2171-8814
pISSN - 0030-3917
DOI - 10.7149/opa.52.2.50127
Subject(s) - sputtering , raman spectroscopy , cadmium telluride photovoltaics , materials science , layer (electronics) , thin film , ellipsometry , thin layer , optoelectronics , analytical chemistry (journal) , optics , nanotechnology , chemistry , physics , environmental chemistry
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