Open AccessDeformation Measurement of Electronic Components in Mobile Device Using High Sensitivity Shadow Moiré Technique
Author(s) -
Hee-Gul Yang,
Jinwon Joo
Publication year - 2017
Publication title -
journal of the microelectronics and packaging society
Language(s) - English
Resource type - Journals
eISSN - 2287-7525
pISSN - 1226-9360
DOI - 10.6117/kmeps.2017.24.1.057
Subject(s) - moiré pattern , sensitivity (control systems) , materials science , optics , displacement (psychology) , physics , electronic engineering , engineering , psychology , psychotherapist
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom