Open AccessStudy of Standardization and Test Certification for Wearable Smart Devices
Author(s) -
Tae-Su Han,
Deokkee Kim,
Oh-Young Kwon,
SungHoon Choa
Publication year - 2016
Publication title -
maikeuro jeonja mit paekijing hakoeji/ma'ikeu'ro jeonja mic pae'kijing haghoeji
Language(s) - English
Resource type - Journals
eISSN - 2287-7525
pISSN - 1226-9360
DOI - 10.6117/kmeps.2016.23.4.011
Subject(s) - standardization , certification , wearable computer , wearable technology , reliability (semiconductor) , quality (philosophy) , computer science , risk analysis (engineering) , embedded system , business , political science , law , operating system , power (physics) , philosophy , physics , epistemology , quantum mechanics