Open AccessStudy of Standardization and Test Certification for Wearable Smart Devices
Author(s) -
Tae-Su Han,
Deokkee Kim,
OhYoung Kwon,
SungHoon Choa
Publication year - 2016
Publication title -
journal of the microelectronics and packaging society
Language(s) - English
Resource type - Journals
eISSN - 2287-7525
pISSN - 1226-9360
DOI - 10.6117/kmeps.2016.23.4.011
Subject(s) - standardization , certification , wearable computer , wearable technology , reliability (semiconductor) , quality (philosophy) , computer science , risk analysis (engineering) , embedded system , business , political science , law , operating system , power (physics) , philosophy , physics , epistemology , quantum mechanics
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