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A New Synthetic Test Circuit for Testing Thyristor Valve in HVDC Converter
Author(s) -
Kyeong-Tae Kim,
Byung-Moon Han,
Jae-Hun Jung,
EuiCheol Nho,
Yong-Ho Chung,
Seung-Taek Baek
Publication year - 2012
Publication title -
the transactions of the korean institute of power electronics
Language(s) - English
Resource type - Journals
eISSN - 2288-6281
pISSN - 1229-2214
DOI - 10.6113/tkpe.2012.17.3.191
Subject(s) - hvdc converter , thyristor , integrated gate commutated thyristor , mos controlled thyristor , hvdc converter station , thyristor drive , electrical engineering , engineering , voltage , transformer

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